Image Analysis Lab-FEI TEM

FEI Transmission Electron Microscope

High resolution TEM with top entry stage
High-Voltage range: 40 to 100kV in steps of 10kV
Intensity zoom: allows for constant screen brightness at different magnifications
Intensity limit: prevents electron beam intensity overload on sample
Magnification: 25 - 200000 x
Automatic saving of full exposure sequence
Integrated Dual Pentium PC with Windows operating system