Image Analysis Lab - Texas A&M University

Facilities

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FEI Morgagni

FEI Transmission Electron Microscope

  • High resolution TEM with top entry stage
  • High-Voltage range: 40 to 100kV in steps of 10kV
  • Intensity zoom: allows for constant screen brightness at different magnifications
  • Intensity limit: prevents electron beam intensity overload on sample
  • Magnification: 25 - 200000 x
  • Automatic saving of full exposure sequence
  • Integrated Dual Pentium PC with Windows operating system